Phase dependence in radar cross section measurements [microform] / Lorant Muth.

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Bibliographic Details
Main Author: Muth, Lorant A.
Corporate Author: National Institute of Standards and Technology (U.S.)
Format: Government Document Microfilm Book
Language:English
Published: [Washington, D.C.] : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2001.
Series:NIST technical note ; 1522.
Subjects:
Description
Item Description:"September 2001."
Shipping list number: 2002-0259-M.
Physical Description:15 pages.