Phase dependence in radar cross section measurements [microform] / Lorant Muth.

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Bibliographic Details
Main Author:	Muth, Lorant A.
Corporate Author:	National Institute of Standards and Technology (U.S.)
Format:	Government Document Microfilm Book
Language:	English
Published:	[Washington, D.C.] : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2001.
Series:	NIST technical note ; 1522.
Subjects:	Radar cross sections.

Norlin Library - Government Information - Microform

Holdings details from Norlin Library - Government Information - Microform
Call Number:	C 13.46:1522
C 13.46:1522	Restricted Place a Hold