Radar sensor technology XII : 18-19 March, 2008, Orlando, Florida, USA / Kenneth I. Ranney, Armin W. Doerry, editors ; sponsored and published by SPIE.

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Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library)
Corporate Author:	SPIE (Society)
Other Authors:	Ranney, Kenneth I., Doerry, Armin W.
Format:	eBook
Language:	English
Published:	Bellingham, Wash. : SPIE, ©2008.
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 6947.
Subjects:	Millimeter waves > Congresses. Millimeter wave devices > Congresses. Imaging systems > Congresses. Radar > Congresses. Target acquisition > Congresses. Pattern recognition systems > Congresses. Imaging systems. Millimeter wave devices. Millimeter waves. Pattern recognition systems. Radar. Target acquisition. Conference papers and proceedings.

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Call Number:	TK7876.5
TK7876.5	Available