Optical pattern recognition XIX [electronic resource] : 17-18 March 2008, Orlando, Florida, USA / David P. Casasent, Tien-Hsin Chao, editors ; sponsored and published by SPIE.

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Bibliographic Details
Online Access: Full Text (via SPIE Digital Library)
Corporate Author: SPIE (Society)
Other Authors: Casasent, D. P. (David Paul), Chao, Tien-Hsin
Other title:SPIE digital library.
Format: Electronic eBook
Language:English
Published: Bellingham, Wash. : SPIE, 2008.
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 6977.
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