Two- and three-dimensional methods for inspection and metrology V [electronic resource] : 11-12 September 2007, Boston, Massachusetts, USA / Peisen S. Huang, editor ; sponsored and published by SPIE.

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Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library)
Corporate Author:	SPIE (Society)
Other Authors:	Huang, Peisen S.
Other title:	SPIE digital library.
Format:	Electronic eBook
Language:	English
Published:	Bellingham, Wash. : SPIE, ©2007.
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 6762.
Subjects:	Computer vision > Congresses. Imaging systems > Congresses. Three-dimensional display systems > Congresses. Quality control > Optical methods > Congresses. Optical measurements > Congresses. Metrology > Congresses. Computer vision. Imaging systems. Metrology. Optical measurements. Quality control > Optical methods. Three-dimensional display systems. Conference papers and proceedings.

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Call Number:	TA1632 .T89 2007e
TA1632 .T89 2007e	Available