Evaluation of a standard test method for total hemispherical emittance of surfaces from 293 K to 1673 K [microform] / E. Conrad Compton.
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| Format: | Government Document Microfilm Book |
| Language: | English |
| Published: |
Hampton, Va. :
National Aeronautics and Space Administration, Langley Research Center,
[1986]
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| Series: | NASA technical memorandum ;
87681. |
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