Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale / Sergei Kalinin, Alexei Gruverman, editors.
"Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging fro...
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| Other Authors: | , |
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| Other title: | Electrical and electromechanical phenomena at the nanoscale. |
| Format: | Book |
| Language: | English |
| Published: |
New York :
Springer,
©2007.
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| Subjects: |
Norlin Library - Science Stacks
| Call Number: |
QH212.S33 S395 2007
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| QH212.S33 S395 2007 (v.1) | Available Place a Hold |
| QH212.S33 S395 2007 (v.2) | Available Place a Hold |