Advanced production testing of RF, SoC, and SiP devices / Joe Kelly, Michael Engelhardt.

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Bibliographic Details
Main Author:	Kelly, Joe, Ph. D.
Other Authors:	Engelhardt, Michael D.
Format:	Book
Language:	English
Published:	Norwood, MA : Artech House, 2007.
Series:	Artech House microwave library.
Subjects:	Systems on a chip > Testing.

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Holdings details from PASCAL Offsite
Call Number:	TK7895.E42 K49 2007
TK7895.E42 K49 2007	Available Place a Hold