Noise in devices and circuits [electronic resource] : 2-4 June, 2003, Santa Fe, New Mexico, USA / M. Jamal Deen, Zeynep Çelik-Butler, Michael E. Levinshtein, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, National Semiconductor Corporation ; published by SPIE--the International Society for Optical Engineering.

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Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library)
Corporate Authors:	Society of Photo-Optical Instrumentation Engineers, National Semiconductor Corporation, SPIE Digital Library
Other Authors:	Deen, M. Jamal, Çelik-Butler, Zeynep, Levinshteĭn, M. E. (Mikhail Efimovich)
Format:	Electronic eBook
Language:	English
Published:	Bellingham, Wash. : SPIE, ©2003.
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 5113.
Subjects:	Electronic circuits > Noise > Congresses. Electronic noise > Congresses. Electric circuits > Noise > Congresses. Electric noise > Congresses.

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Call Number:	TK7867.5 .N646 2003
TK7867.5 .N646 2003	Available