Bibliographic Details
Online Access: |
Full Text (via SPIE Digital Library)
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Corporate Authors: |
International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life Novosibirsk, Russia,
Institut lazernoĭ fiziki SO RAN,
TDI SIE--Technological Design Institute of Scientific Instrument Engineering (Russia),
Society of Photo-Optical Instrumentation Engineers |
Other Authors: |
Chugui, Yuri V. |
Other title: | 7th International Symposium on Laser Metrology.
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Format: | Electronic
Conference Proceeding
eBook
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Language: | English |
Published: |
Bellingham, Wash. :
SPIE, International Society for Optical Engineering,
©2002.
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Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 4900.
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Subjects: | |