Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life [electronic resource] : 9-13 September 2002, Novosibirsk, Russia / Yuri V. Chugui [and others], chairs/editors ; co-organized by TDI SIE--Technological Design Institute of Scientific Instrument Engineering (Russia), ILP--Institute of Laser Physics (Russia) ; sponsored by SPIE--The International Society for Optical Engineering [and others]

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Corporate Authors: International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life Novosibirsk, Russia, Institut lazernoĭ fiziki SO RAN, TDI SIE--Technological Design Institute of Scientific Instrument Engineering (Russia), Society of Photo-Optical Instrumentation Engineers
Other Authors: Chugui, Yuri V.
Other title:7th International Symposium on Laser Metrology.
Format: Electronic Conference Proceeding eBook
Language:English
Published: Bellingham, Wash. : SPIE, International Society for Optical Engineering, ©2002.
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4900.
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Call Number: TA1673 .I5873 2002
TA1673 .I5873 2002 Available