Laser metrology for precision measurement and inspection in industry [electronic resource] : 13-15 October 1999, Florianópolis, Brazil / Armando Albertazzi, Jr., editor ; promoted by IMEKO--the International Measurement Confederation, Brazilian Society of Metrology, [and] SPIE--the International Society for Optical Engineering.

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Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library)
Corporate Authors:	International Measurement Confederation, Sociedade Brasileira de Metrologia, Society of Photo-Optical Instrumentation Engineers, SPIE Digital Library, International Symposium on Laser Metrology for Precision Measurement and Inspection in Industry
Other Authors:	Albertazzi, Armando, Jr
Other title:	Laser metrology 1999.
Format:	Electronic Conference Proceeding eBook
Language:	English
Published:	Bellingham, Wash., USA : SPIE, ©2001.
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 4420.
Subjects:	Measurement > Congresses. Optical measurements > Congresses. Laser interferometers > Congresses. Laser interferometers. Measurement. Optical measurements. Conference papers and proceedings.

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Call Number:	TA1673 .L3573 2001
TA1673 .L3573 2001	Available