Internal standardization and calibration architectures for chemical sensors 20-22 September, 1999, Boston, Massachusetts /

Internal standardization and calibration architectures for chemical sensors [electronic resource] : 20-22 September, 1999, Boston, Massachusetts / Ronald E. Schaffer, Radislav A. Potyrailo, chairs/editors ; sponsored by SPIE--The International Society for Optical Engineering ; cooperating organization, Air and Waste Management Association, Optical Sciences Division ; published by SPIE.

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Bibliographic Details
Online Access: Full Text (via SPIE Digital Library)
Corporate Authors: Society of Photo-Optical Instrumentation Engineers, Air & Waste Management Association. Optical Sciences Division, SPIE Digital Library
Other Authors: Shaffer, Ronald E., Potyrailo, Radislav A.
Format: Electronic eBook
Language:English
Published: Bellingham, Wash. : SPIE, ©1999.
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 3856.
Subjects:
Chemical detectors > Congresses.
Microchemistry > Congresses.
Chemical detectors.
Microchemistry.
Conference papers and proceedings.
Description
Physical Description:1 online resource (ix, 330 pages) : illustrations.
Bibliography:Includes bibliographical references and author index.

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