Internal standardization and calibration architectures for chemical sensors [electronic resource] : 20-22 September, 1999, Boston, Massachusetts / Ronald E. Schaffer, Radislav A. Potyrailo, chairs/editors ; sponsored by SPIE--The International Society for Optical Engineering ; cooperating organization, Air and Waste Management Association, Optical Sciences Division ; published by SPIE.

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Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library)
Corporate Authors:	Society of Photo-Optical Instrumentation Engineers, Air & Waste Management Association. Optical Sciences Division, SPIE Digital Library
Other Authors:	Shaffer, Ronald E., Potyrailo, Radislav A.
Format:	Electronic eBook
Language:	English
Published:	Bellingham, Wash. : SPIE, ©1999.
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3856.
Subjects:	Chemical detectors > Congresses. Microchemistry > Congresses. Chemical detectors. Microchemistry. Conference papers and proceedings.

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Call Number:	TP159.C46 I55 1999
TP159.C46 I55 1999	Available