Automated optical inspection for industry: theory, technology, and applications II 16-19 September, 1998, Beijing, China /

Automated optical inspection for industry: theory, technology, and applications II [electronic resource] : 16-19 September, 1998, Beijing, China / Shenghua Ye, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering, COEMA--China Optics & Optoelectronic Manufacturers Association, COS--Chinese Optical Society ; cooperating organizations, National Natural Science Foundation of China [and others]

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Bibliographic Details
Online Access: Full Text (via SPIE Digital Library)
Corporate Authors: Society of Photo-Optical Instrumentation Engineers, Zhongguo guang xue xue hui, Chinese Optics & Optoelectronic Manufacturers Association, SPIE Digital Library
Other Authors: Ye, Shenghua, 1934-
Format: Electronic eBook
Language:English
Published: Bellingham, Wash. : SPIE, ©1998.
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 3558.
Subjects:
Engineering inspection > Automation > Congresses.
Quality control > Optical methods > Automation > Congresses.
Optical detectors > Industrial applications > Congresses.
Optical measurements > Congresses.
Engineering inspection > Automation.
Optical detectors > Industrial applications.
Optical measurements.
Quality control > Optical methods > Automation.
Conference papers and proceedings.

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Full Text (via SPIE Digital Library)

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Call Number: TS156.2 .A892 1998
TS156.2 .A892 1998 Available

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