Testing for EMC compliance : approaches and techniques /

Testing for EMC compliance : approaches and techniques / Mark I. Montrose, Edward M. Nakauchi.

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Bibliographic Details
Main Author: Montrose, Mark I.
Corporate Author: IEEE Electromagnetic Compatibility Society
Other Authors: Nakauchi, Edward M.
Format: Book
Language:English
Published: Hoboken, NJ : IEEE Press/Wiley-Interscience, ©2004.
Subjects:
Electromagnetic compatibility.
Electromagnetic interference.

Closed Stacks - Engineering Math & Physics Library - Stacks

Holdings details from Closed Stacks - Engineering Math & Physics Library - Stacks
Call Number: TK7867.2 .M66 2004
TK7867.2 .M66 2004 Available Place a Hold

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