Lock-in thermography : basics and use for functional diagnostics of electronic components / O. Breitenstein, M. Langenkamp.

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Bibliographic Details
Main Author:	Breitenstein, O. (Otwin)
Other Authors:	Langenkamp, M. (Martin), 1964-
Format:	Book
Language:	English
Published:	Berlin ; New York : Springer, ©2003.
Series:	Springer series in advanced microelectronics ; 10.
Subjects:	Electronic apparatus and appliances > Thermal properties. Electronic apparatus and appliances > Testing. Semiconductors > Thermal properties. Thermography.

Closed Stacks - Engineering Math & Physics Library - Stacks

Holdings details from Closed Stacks - Engineering Math & Physics Library - Stacks
Call Number:	TK7870.25 .B74 2003
TK7870.25 .B74 2003	Withdrawn