Noise in devices and circuits : 2-4 June, 2003, Santa Fe, New Mexico, USA / M. Jamal Deen, Zeynep Çelik-Butler, Michael E. Levinshtein, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, National Semiconductor Corporation.
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| Corporate Authors: | , |
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| Other Authors: | , , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash. :
SPIE,
©2003.
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 5113. |
| Subjects: |
PASCAL Offsite
| Call Number: |
TK7867.5 .N646 2003
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|---|---|
| TK7867.5 .N646 2003 | Available Place a Hold |