High resolution focused ion beams : FIB and its applications : the physics of liquid metal ion sources and ion optics and their application to focused ion beam technology / Jon Orloff, Mark Utlaut and Lynwood Swanson.
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| Other Authors: | , , |
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| Format: | Book |
| Language: | English |
| Published: |
New York :
Kluwer Academic,
©2003.
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| Subjects: |
PASCAL Offsite
| Call Number: |
QC702.7.B65 H65 2003
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| QC702.7.B65 H65 2003 | Available Place a Hold |