Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life : 9-13 September 2002, Novosibirsk, Russia / Yuri V. Chugui [and others], chairs/editors ; co-organized by TDI SIE--Technological Design Institute of Scientific Instrument Engineering (Russia) [and] ILP--Institute of Laser Physics (Russia) ; sponsored by SPIE--the International Society for Optical Engineering [and others] ; endorsed by IMEKO--International Measurement Confederation [and others] ; cooperating organizations, IAE--Institute of Automation and Electrometry (Russia) [and others]

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Bibliographic Details
Corporate Authors:	International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life Novosibirsk, Russia, Society of Photo-Optical Instrumentation Engineers, Scientific Instrument Engineering (Russia). Technological Design Institute, Institut lazernoĭ fiziki SO RAN, International Measurement Confederation, Institut avtomatiki i ėlektrometrii (Rossiĭskai︠a︡ akademii︠a︡ nauk)
Other Authors:	Chugui, Yuri V.
Other title:	7th International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life. International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life. Laser metrology applied to science, industry, and everyday life.
Format:	Conference Proceeding Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, ©2002.
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 4900.
Subjects:	Measurement > Congresses. Optical measurements > Industrial applications > Congresses. Lasers > Industrial applications > Congresses. Laser interferometers > Congresses.

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