Proceedings of scanning and force microscopies for biomedical applications : 24-25 January 1999, San Jose, California / Eiichi Tamiya, Shuming Nie, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] IBOS--International Biomedical Optics Society.

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Bibliographic Details
Corporate Authors:	Society of Photo-Optical Instrumentation Engineers, International Biomedical Optics Society
Other Authors:	Tamiya, Eiichi, 1954-, Nie, Shuming
Other title:	Scanning and force microscopies for biomedical applications.
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, ©1999.
Series:	Progress in biomedical optics (Unnumbered) Proceedings of SPIE--the International Society for Optical Engineering ; v. 3607.
Subjects:	Medical electronics > Congresses. Scanning probe microscopy > Congresses. Scanning force microscopy > Congresses. Nanotechnology > Congresses.

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Holdings details from PASCAL Offsite
Call Number:	R856.A2 P76 1999
R856.A2 P76 1999	Available Place a Hold