Evaluation of Pd-Cr wires for strain gage application [microform] / Jih-Fen Lei, L.C. Greer III and L.G. Oberle.

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Bibliographic Details
Main Author:	Lei, Jih-Fen
Corporate Author:	United States. National Aeronautics and Space Administration
Other Authors:	Greer, Lawrence C., Oberle, L. G.
Format:	Government Document Microfilm Book
Language:	English
Published:	[Washington, DC] : [Springfield, Va.] : National Aeronautics and Space Administration ; [National Technical Information Service, distributor], [1995]
Series:	NASA technical memorandum ; 106857.
Subjects:	Chromium compounds. Electrical resistance. Palladium compounds. Strain gages. Strain measurement. Wire.

Norlin Library - Government Information - Microform

Holdings details from Norlin Library - Government Information - Microform
Call Number:	NAS 1.15:106857
NAS 1.15:106857	Restricted Place a Hold