Orientation effects on the measurement and analysis of critical CTOA in an aluminum alloy sheet [microform] / M.A. Sutton, D.S. Dawicke, J.C. Newman.

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Bibliographic Details
Main Author: Sutton, M. A.
Corporate Author: Langley Research Center
Other Authors: Dawicke, D. S., Newman, J. C.
Format: Government Document Microfilm Book
Language:English
Published: Hampton, Va. : [Springfield, Va.] : National Aeronautics and Space Administration, Langley Research Center ; [National Technical Information Service, distributor], [1994]
Series:NASA technical memorandum ; 109153.
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Norlin Library - Government Information - Microform

Holdings details from Norlin Library - Government Information - Microform
Call Number: NAS 1.15:109153
NAS 1.15:109153 Restricted Place a Hold