The electromagnetic modeling of thin apertures using the finite-difference time-domain technique [microform] / Kenneth R. Demarest.
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Corporate Author: | |
Format: | Government Document Microfilm Book |
Language: | English |
Published: |
Hampton, Va. : [Springfield, Va.] :
National Aeronautics and Space Administration, Langley Research Center ; [National Technical Information Service, distributor],
[1987]
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Series: | NASA contractor report ;
NASA CR-178280. |
Subjects: |
Norlin Library - Government Information - Microform
Call Number: |
NAS 1.26:178280
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NAS 1.26:178280 | Restricted Place a Hold |