Testing and failure analysis to improve screening techniques for hermetically sealed metallized film capacitors for low energy applications [microform] : final report.
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| Corporate Authors: | , |
|---|---|
| Format: | Government Document Microfilm Book |
| Language: | English |
| Published: |
[Washington, D.C.?] :
[National Aeronautics and Space Administration],
[1982]
|
| Series: | NASA contractor report ;
NASA CR-162071. |
| Subjects: |