Numerical experiments with a symmetric high-resolution shock-capturing scheme [microform] / H.C. Yee.

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Bibliographic Details
Main Author:	Yee, H. C. (Helen C.)
Corporate Author:	Ames Research Center
Format:	Government Document Microfilm Book
Language:	English
Published:	Moffett Field, Calif. : [Springfield, Va.] : National Aeronautics and Space Administration, Ames Research Center ; [For sale by the National Technical Information Service], [1986]
Series:	NASA technical memorandum ; 88325.
Subjects:	Numerical analysis.

Norlin Library - Government Information - Microform

Holdings details from Norlin Library - Government Information - Microform
Call Number:	NAS 1.15:88325
NAS 1.15:88325	Restricted Place a Hold