Method to determine the quality of sapphire / M.T. Duffy [and others] ; RCA Laboratories.

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Bibliographic Details
Online Access:	Search for the full-text version of this title in HathiTrust
Corporate Author:	Radio Corporation of America. David Sarnoff Research Center, Princeton, N.J
Other Authors:	Duffy, M. T.
Format:	Government Document Book
Language:	English
Published:	Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1980.
Series:	Semiconductor measurement technology. NBS special publication ; 400-62.
Subjects:	Sapphires > Surfaces > Testing. Specular reflectance > Measurement.

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Holdings details from Norlin Library - Government Information - US
Call Number:	C 13.10:400-62
C 13.10:400-62	Available Place a Hold