Microelectronics manufacturing and reliability : 21-22 September 1992, San Jose, California / Barbara Vasquez [and others], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

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Bibliographic Details
Corporate Author: Society of Photo-Optical Instrumentation Engineers
Other Authors: Vasquez, Barbara
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, ©1993.
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 1802.
Subjects:

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Call Number: TK7874 .M485 1993
TK7874 .M485 1993 Available Place a Hold