Scanning tunneling microscopy and related methods / edited by R.J. Behm, N. Garcia, H. Rohrer.

Saved in:

Bibliographic Details
Corporate Author:	NATO Advanced Study Institute on Basic Concept and Applications of Scanning Tunneling Microscopy Erice, Italy
Other Authors:	Behm, R. J., García, N. (Nicolás), Rohrer, Hermann
Format:	Conference Proceeding Book
Language:	English
Published:	Dordrecht ; Boston : Kluwer Academic Publishers, 1990.
Series:	NATO ASI series. Applied sciences ; no. 184.
Subjects:	Scanning tunneling microscopy > Congresses. Surfaces (Physics) > Congresses.

PASCAL Offsite

Holdings details from PASCAL Offsite
Call Number:	QC173.4.S94 N379 1989
QC173.4.S94 N379 1989	Available Place a Hold