Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.

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Bibliographic Details
Main Author:	Abramovici, Miron
Other Authors:	Breuer, Melvin A., Friedman, Arthur D.
Format:	Book
Language:	English
Published:	New York, NY : Computer Science Press, ©1990.
Series:	Electrical engineering communications and signal processing series.
Subjects:	Digital integrated circuits > Testing. Digital integrated circuits > Design and construction.

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