Semiconductor reliability.

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Bibliographic Details
Corporate Authors:	United States. Advisory Group on Electron Tubes, Aerospace Industries Association of America, Conference on Reliability of Semiconductor Devices, Conference on Reliability Assurance Techniques for Semiconductor Specifications
Other Authors:	Shwop, John E., Von Alven, William H.
Format:	Conference Proceeding Book
Language:	English
Published:	Elizabeth, N.J. : Engineering Publishers; trade distributors: Reinhold Pub. Corp., New York, [1961-62]
Subjects:	Semiconductors > Reliability > Congresses.

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