Characterization, testing, measurement, and metrology / edited by Chander Prakash, Sunpreet Singh, and J. Paulo Davim.

"This book presents the broad aspects of measurement, performance analysis, and characterization for materials and devices by advanced manufacturing processes. The field of measurement and metrology as a pre-condition for maintaining high quality products/devices/systems in materials and advanc...

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Bibliographic Details
Online Access: Full Text (via Taylor & Francis)
Other Authors: Prakash, Chander (Editor), Singh, Sunpreet, 1989- (Editor), Davim, J. Paulo (Editor)
Format: eBook
Language:English
Published: Boca Raton, FL : CRC Press, 2021.
Edition:First edition.
Series:Manufacturing design and technology series.
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Call Number: TA410 .C457 2021
TA410 .C457 2021 Available