Characterization, testing, measurement, and metrology / edited by Chander Prakash, Sunpreet Singh, and J. Paulo Davim.
"This book presents the broad aspects of measurement, performance analysis, and characterization for materials and devices by advanced manufacturing processes. The field of measurement and metrology as a pre-condition for maintaining high quality products/devices/systems in materials and advanc...
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Online Access: |
Full Text (via Taylor & Francis) |
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Other Authors: | , , |
Format: | eBook |
Language: | English |
Published: |
Boca Raton, FL :
CRC Press,
2021.
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Edition: | First edition. |
Series: | Manufacturing design and technology series.
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Subjects: |
Internet
Full Text (via Taylor & Francis)Online
Call Number: |
TA410 .C457 2021
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TA410 .C457 2021 | Available |