Introduction to the characterization of residual stress by neutron diffraction / Michael T. Hutchings, Philip J. Withers, Thomas M. Holden, Torben Lorentzen.
Over the past 25 years the field of neutron diffraction for residual stress characterization has grown tremendously, and has matured from the stage of trial demonstrations to provide a practical tool with widespread applications in materials science and engineering. While the literature on the subje...
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Full Text (via Taylor & Francis) |
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| Main Authors: | , , , |
| Format: | eBook |
| Language: | English |
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Boca Raton, FL :
Taylor & Francis,
2005.
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TA417.25 .I59 2005eb
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| TA417.25 .I59 2005eb | Available |