A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films / Frank L. McCrackin.

Saved in:

Bibliographic Details
Online Access:	Online Access
Main Author:	McCrackin, F. L. (Frank L.)
Corporate Author:	United States. National Bureau of Standards
Format:	Government Document eBook
Language:	English
Published:	Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1964.
Series:	NBS technical note ; 242.
Subjects:	FORTRAN (Computer program language) Thin films > Optical properties.

Internet

Online Access

Holdings details from Online
Call Number:	C 13.46:242
C 13.46:242	Available