RGB interferometry for optical metrology / by Paul Kumar Upputuri, Nandigana Krishna Mohan, and Mahendra Prasad Kothiyal.
This Spotlight discusses the theoretical and experimental aspects of RGB interferometry. It also focuses on various advanced RGB interferometers and their applications for 3-D surface profiling, deformation measurements, non-destructive testing (NDT), refractive index profiling of biological cells/t...
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| Online Access: |
Full Text (via SPIE Digital Library) |
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| Main Authors: | , , |
| Format: | eBook |
| Language: | English |
| Published: |
Bellingham, Washington (1000 20th St. Bellingham WA 98225-6705 USA) :
SPIE,
2019.
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| Series: | SPIE spotlight ;
SL55. |
| Subjects: |
Internet
Full Text (via SPIE Digital Library)Online
| Call Number: |
QC367.3.I58 U658 2019
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| QC367.3.I58 U658 2019 | Available |