Stress-strain behavior of cold-welded copper-copper microjunctions in vacuum as determined from electrical resistance measurements / by John S. Przybyszewski.
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Online Access |
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| Format: | Government Document eBook |
| Language: | English |
| Published: |
Washington, D.C. :
National Aeronautics and Space Administration,
August 1968.
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| Series: | NASA technical note ;
D-4743. |
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Internet
Online AccessOnline
| Call Number: |
NAS 1.14:D-4743
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| NAS 1.14:D-4743 | Available |