Nanoscale redox reaction at metal/oxide interface [electronic resource] : a case study on Schottky contact and ReRAM / Takahiro Nagata.
This book examines the investigation and intentional control of metal/oxide interface structure and electrical properties with the data obtained using non-destructive methods such as x-ray photoelectron spectroscopy (XPS) and x-ray reflectometry (XRR)
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| Online Access: |
Full Text (via Springer) |
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| Format: | Electronic eBook |
| Language: | English |
| Published: |
Tokyo :
Springer,
2020.
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| Series: | NIMS monographs.
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| Subjects: |
Internet
Full Text (via Springer)Online
| Call Number: |
QD63.O9
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| QD63.O9 | Available |