Integration of test with design and manufacturing : proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, Washington, D.C. / sponsored by the IEEE Computer Society, IEEE Philadelphia Section.

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Bibliographic Details
Corporate Authors:	International Test Conference Washington, D.C., IEEE Computer Society, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format:	Conference Proceeding Book
Language:	English
Published:	Washington, D.C. : Los Angeles, CA : Computer Society Press of the IEEE ; Order from Computer Society of the IEEE, ©1987.
Subjects:	Integrated circuits > Testing > Congresses. Electronic digital computers > Circuits > Testing > Congresses. Automatic test equipment > Congresses. Automatic test equipment. Electronic digital computers > Circuits > Testing. Integrated circuits > Testing. Conference papers and proceedings.

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Holdings details from PASCAL Offsite
Call Number:	TK7874 .I593 1987
TK7874 .I593 1987	Available Place a Hold