VLSI design and test : 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised selected papers / Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, Santosh Kumar Vishvakarma (eds.)

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Bibliographic Details
Online Access: Full Text (via Springer)
Corporate Author: VDAT (Symposium) Indore, India)
Other Authors: Sengupta, Anirban (Editor), Dasgupta, Sudeb (Editor), Singh, Virendra (Associate professor of electrical engineering) (Editor), Sharma, Rohit (Rohit Y.) (Editor), Vishvakarma, Santosh Kumar (Editor)
Other title:VDAT 2019.
Format: Conference Proceeding eBook
Language:English
Published: Singapore : Springer, 2019.
Series:Communications in computer and information science ; 1066.
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Call Number: TK7874.75
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