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  1. 1
    Large scale integration digital testing : annotated bibliography, 1969-1978 /

    Large scale integration digital testing : annotated bibliography, 1969-1978 / by Leedy, T. F.

    Published 1979
    “…NBS technical note ;…”
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  2. 2
    Bibliography on the measurement of bulk resistivity of semiconductor materials for electron devices /

    Bibliography on the measurement of bulk resistivity of semiconductor materials for electron devices / by French, Judson C.

    Published 1964
    “…NBS technical note ;…”
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  3. 3
    Tabulation of published data on electron devices of the U.S.S.R. through March 1970 /

    Tabulation of published data on electron devices of the U.S.S.R. through March 1970 / by Marsden, Charles P.

    Published 1970
    “…NBS technical note ;…”
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  4. 4
    Tabulation of published data on electron devices of the U.S.S.R. through December 1973 /

    Tabulation of published data on electron devices of the U.S.S.R. through December 1973 / by Marsden, Charles P.

    Published 1974
    “…NBS technical note ;…”
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  5. 5
    Three guises of generation-recombination noise /

    Three guises of generation-recombination noise / by Cohen, Julius

    Published 1983
    “…NBS technical note ;…”
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  6. 6
    Three guises of generation-recombination noise /

    Three guises of generation-recombination noise / by Cohen, Julius, 1926-

    Published 1983
    “…NBS technical note ;…”
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  7. 7
    Three guises of generation-recombination noise /

    Three guises of generation-recombination noise / by Cohen, Julius, 1926-

    Published 1983
    “…NBS technical note ;…”
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  8. 8
    Methods of measurement for semiconductor materials, process control, and devices : quarterly report, July 1 to September 30, 1969 /

    Methods of measurement for semiconductor materials, process control, and devices : quarterly report, July 1 to September 30, 1969 /

    Published 1970
    “…NBS technical note ;…”
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  9. 9
    Methods of measurement for semiconductor materials, process control, and devices : quarterly report, January 1 to March 31, 1970 /

    Methods of measurement for semiconductor materials, process control, and devices : quarterly report, January 1 to March 31, 1970 /

    Published 1970
    “…NBS technical note ;…”
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  10. 10
    Methods of measurement for semiconductor materials, process control, and devices. : quarterly report, Oct. 1 to Dec. 31, 1970 /

    Methods of measurement for semiconductor materials, process control, and devices. : quarterly report, Oct. 1 to Dec. 31, 1970 /

    Published 1971
    “…NBS technical note ;…”
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  11. 11
    Bibliography on the measurement of bulk resistivity of semiconductor materials for electron devices /

    Bibliography on the measurement of bulk resistivity of semiconductor materials for electron devices / by French, Judson C.

    Published 1964
    “…NBS technical note ;…”
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  12. 12
    Correction factor tables for four-point probe resistivity measurements on thin, circular semiconductor samples /

    Correction factor tables for four-point probe resistivity measurements on thin, circular semiconductor samples / by Swartzendruber, L. J.

    Published 1964
    “…NBS technical note ;…”
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  13. 13
    A general survey of the semiconductor field /

    A general survey of the semiconductor field / by Reimherr, George W.

    Published 1962
    “…NBS technical note ;…”
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  14. 14
    Methods of measurement for semiconductor materials, process control, and devices : quarterly report, April 1 to June 30, 1969 /

    Methods of measurement for semiconductor materials, process control, and devices : quarterly report, April 1 to June 30, 1969 /

    Published 1969
    “…NBS technical note ;…”
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  15. 15
    Tabulation of published data on electron devices of the U.S.S.R. through March 1970 /

    Tabulation of published data on electron devices of the U.S.S.R. through March 1970 / by Marsden, Charles P.

    Published 1970
    “…NBS technical note ;…”
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  16. 16
    Methods of measurement for semiconductor materials, process control, and devices. : Quarterly report, July 1 to Sept. 30, 1968 /

    Methods of measurement for semiconductor materials, process control, and devices. : Quarterly report, July 1 to Sept. 30, 1968 /

    Published 1968
    “…NBS technical note ;…”
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  17. 17
    Methods of measurement for semiconductor materials, process control, and devices : quarterly report, October 1 to December 31, 1968 /

    Methods of measurement for semiconductor materials, process control, and devices : quarterly report, October 1 to December 31, 1968 /

    Published 1969
    “…NBS technical note ;…”
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  18. 18
    Methods of measurement for semiconductor materials, process control, and devices : quarterly report, January 1 to March 31, 1969 /

    Methods of measurement for semiconductor materials, process control, and devices : quarterly report, January 1 to March 31, 1969 /

    Published 1969
    “…NBS technical note ;…”
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  19. 19
    A bibliography on methods for the measurement of inhomogeneities in semiconductors, 1953-1967 /

    A bibliography on methods for the measurement of inhomogeneities in semiconductors, 1953-1967 / by Schafft, Harry A., Needham, Susan Gayle

    Published 1968
    “…NBS technical note ;…”
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  20. 20
    Tabulation of data on semiconductor amplifiers and oscillators at microwave frequencies /

    Tabulation of data on semiconductor amplifiers and oscillators at microwave frequencies / by Marsden, Charles P., Cowan, Rita Y.

    Published 1970
    “…NBS technical note ;…”
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