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  1. 1
    Practical optical dimensional metrology /

    Practical optical dimensional metrology / by Harding, Kevin G.

    Published 2019
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  2. 2
    Optical metrology for precision engineering /

    Optical metrology for precision engineering / by Gao, Wei, 1965-, Shimizu, Yuki

    Published 2022
    Full Text (via Knovel)
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  3. 3
    Besoins nationaux et internationaux dans le domaine de la metrologie : les colloborations internationales et le role du BIPM = National and international needs relating to metrology : international collaborations and the role of the BIPM.

    Besoins nationaux et internationaux dans le domaine de la metrologie : les colloborations internationales et le role du BIPM = National and international needs relating to metrolog...

    Published 1998
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  4. 4
    How mathematics happened : the first 50,000 years /

    How mathematics happened : the first 50,000 years / by Rudman, Peter Strom

    Published 2007
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  5. 5
    The seven measures of the world /

    The seven measures of the world / by Martin, Piero

    Published 2023
    Full Text (via De Gruyter)
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  6. 6
    How mathematics happened : the first 50,000 years /

    How mathematics happened : the first 50,000 years / by Rudman, Peter Strom

    Published 2007
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  7. 7
    Interferometry XII : techniques and analysis : 2-3 August, 2004, Denver Colorado, USA /

    Interferometry XII : techniques and analysis : 2-3 August, 2004, Denver Colorado, USA /

    Published 2004
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  8. 8
    Two- and three-dimensional vision systems for inspection, control, and metrology : 29-30 October 2003, Providence, Rhode Island, USA /

    Two- and three-dimensional vision systems for inspection, control, and metrology : 29-30 October 2003, Providence, Rhode Island, USA /

    Published 2004
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  9. 9
    Interferometry XI : techniques and analysis, 8-10 July 2002, Seattle USA /

    Interferometry XI : techniques and analysis, 8-10 July 2002, Seattle USA /

    Published 2002
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  10. 10
    Terahertz metrology /

    Terahertz metrology /

    Published 2015
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  11. 11
    Quality assurance for chemistry and environmental science : metrology from pH measurement to nuclear waste disposal /

    Quality assurance for chemistry and environmental science : metrology from pH measurement to nuclear waste disposal / by Meinrath, Günther

    Published 2007
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  12. 12
    Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July, 2002, Seattle, Washington, USA /

    Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July, 2002, Seattle, Washington, USA /

    Published 2002
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  13. 13
    Recent advances in metrology and fundamental constants : Varenna on Lake Como, Villa Monastero, 25 July-4 August 2000 /

    Recent advances in metrology and fundamental constants : Varenna on Lake Como, Villa Monastero, 25 July-4 August 2000 /

    Published 2001
    Conference Proceeding Book
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  14. 14
    Automotive engine metrology /

    Automotive engine metrology / by Ali, Salah H. R.

    Published 2017
    Full Text (via Taylor & Francis)
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  15. 15
    International journal of metrology and quality engineering

    International journal of metrology and quality engineering

    Published 2010
    Online Access (A-Z Journals and Newspapers)
    Electronic Serial
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  16. 16
    Introduction to optical metrology /

    Introduction to optical metrology / by Sirohi, R. S.

    Published 2016
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  17. 17
    Advanced mathematical & computational tools in metrology & testing VIII /

    Advanced mathematical & computational tools in metrology & testing VIII /

    Published 2009
    Conference Proceeding Book
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  18. 18
    Surface scattering and diffraction for advanced metrology II : 9 July, 2002, Seattle, Washington, USA /

    Surface scattering and diffraction for advanced metrology II : 9 July, 2002, Seattle, Washington, USA /

    Published 2002
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  19. 19
    The making of measure and the promise of sameness /

    The making of measure and the promise of sameness / by Lugli, Emanuele

    Published 2019
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  20. 20
    Surface scattering and diffraction for advanced metrology : 1 August 2001, San Diego, USA /

    Surface scattering and diffraction for advanced metrology : 1 August 2001, San Diego, USA /

    Published 2001
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