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  1. 1
    ARPA/NBS workshop I : measurement problems in integrated circuit processing and assembly /

    ARPA/NBS workshop I : measurement problems in integrated circuit processing and assembly / by Schafft, Harry A.

    Published 1974
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  2. 2
    Semiconductor measurement technology, ARPA/NBS workshop II : hermeticity testing for integrated circuits : [synopses] /

    Semiconductor measurement technology, ARPA/NBS workshop II : hermeticity testing for integrated circuits : [synopses] / by Schafft, Harry A.

    Published 1974
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  3. 3
    Semiconductor measurement technology : Optical and dimensional-measurement problems with photomasking in microelectronics /

    Semiconductor measurement technology : Optical and dimensional-measurement problems with photomasking in microelectronics / by Jerke, John M.

    Published 1975
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  4. 4
    The TTL data book for design engineers /

    The TTL data book for design engineers /

    Published 1976
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  5. 5
    Metrology for submicrometer devices and circuits /

    Metrology for submicrometer devices and circuits / by Bullis, W. Murray, 1930-

    Published 1980
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  6. 6
    The TTL logic data book.

    The TTL logic data book.

    Published 1988
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