Suggested Topics within your search.
Suggested Topics within your search.
- Testing
- Materials 672
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- Airplanes 142
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Wafer-Level Testing and Test During Burn-In for Integrated Circuits.
Published 2010Full Text (via ProQuest)
Electronic eBook -
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Review of progress in quantitative nondestructive evaluation Kingston, Rhode Island, 26-31 July 2009 /
Published 2010Full Text (via Scitation)
Electronic Conference Proceeding eBook -
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A probe for accurate determination of moisture content of wood products in use /
Published 1966Government Document Book -
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Dimensional changes in kiln-dried softwood lumber after surfacing and during storage /
Published 1966Government Document Book -
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Experimental techniques in fracture mechanics /
Published 1973Full Text (via Internet Archive)
eBook -
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Testing and diagnosis of analog circuits and systems /
Published 1991Full Text (via Internet Archive)
eBook -
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