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  1. 1
    SEE test report for analog devices ADP3330 high accuracy, ultralow IQ, 200 mA, SOT-23, anyCAP low dropout regulator /

    SEE test report for analog devices ADP3330 high accuracy, ultralow IQ, 200 mA, SOT-23, anyCAP low dropout regulator / by Ladbury, Raymond

    Published 2021
    Subjects: “…Electrical engineering. nasat.…”
    Online Access
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  2. 2
    Single-event effect test report Texas Instruments DS25BR100 LVDS buffer /

    Single-event effect test report Texas Instruments DS25BR100 LVDS buffer / by Wilcox, Ted, Campola, Michael, Joplin, Matt

    Published 2021
    Subjects: “…Electrical engineering. nasat.…”
    Online Access
    Government Document eBook
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  3. 3
    Proton testing of AMD v1202b system on chip /

    Proton testing of AMD v1202b system on chip / by Wyrwas, Edward J.

    Subjects: “…Electrical engineering. nasat.…”
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  4. 4
    Total ionizing dose (TID) testing of the PA10 power operational amplifier /

    Total ionizing dose (TID) testing of the PA10 power operational amplifier / by Ladbury, Raymond, Campola, Michael J., Boutte, Alvin J.

    Published 2021
    Subjects: “…Electrical engineering. nasat.…”
    Online Access
    Government Document eBook
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