Optical measurement technology and instrumentation [electronic resource] : 9-11 May, 2016, Beijing, China / Sen Han, JiuBin Tan, editors.
Saved in:
| Online Access: |
Full Text (via SPIE Digital Library) |
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| Corporate Author: | |
| Other Authors: | , |
| Format: | Electronic Conference Proceeding eBook |
| Language: | English |
| Published: |
Bellingham, Washington, USA :
SPIE,
[2016]
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 10155. |
| Subjects: |
Internet
Full Text (via SPIE Digital Library)Online
| Call Number: |
TA165 .O685 2016
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| TA165 .O685 2016 | Available |