Probabilistic damage characterization using a computationally-efficient Bayesian approach / James E. Warner and Jacob D. Hochhalter.

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Bibliographic Details
Online Access: Online Access
Main Authors: Warner, James E. (Author), Hochhalter, Jacob D. (Author)
Format: Government Document eBook
Language:English
Published: Hampton, Virginia : National Aeronautics and Space Administration, Langley Research Center, March 2016.
Series:NASA technical publication ; 2016-219169.
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Call Number: NAS 1.60:2016-219169
NAS 1.60:2016-219169 Available