Microelectronics Manufacturing Diagnostics Handbook / edited by Abraham H. Landzberg.
This exhaustive new handbook is a practical guide to achieving higher manufacturing yields and greater product reliability. Demonstrating how to put a cap on skyroocketing manufacturing costs, the book reveals ways to pinpoint and quickly correct the defects that reduce overall manufacturing yield.
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Online Access: |
Full Text (via Springer) |
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Main Author: | |
Format: | eBook |
Language: | English |
Published: |
Boston, MA :
Springer US,
1993.
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Subjects: |
MARC
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100 | 1 | |a Landzberg, Abraham H. | |
245 | 1 | 0 | |a Microelectronics Manufacturing Diagnostics Handbook / |c edited by Abraham H. Landzberg. |
260 | |a Boston, MA : |b Springer US, |c 1993. | ||
300 | |a 1 online resource (xxxiii, 633 pages) | ||
336 | |a text |b txt |2 rdacontent. | ||
337 | |a computer |b c |2 rdamedia. | ||
338 | |a online resource |b cr |2 rdacarrier. | ||
347 | |a text file |b PDF |2 rda. | ||
505 | 0 | |a 1 Introduction -- 2 Manufacturing Yield -- 3 Problem Diagnostics -- 4 Manufacturing Defect Classification System -- 5 Product Dimensional Metrology and Pattern Defect Inspection -- 6 Process and Tool Monitoring -- 7 Contamination Monitoring -- 8 Repair and Rework -- 9 Test Sites and Vehicles For Yield and Process Monitoring -- 10 In-Line Electrical Test -- 11 Final Test -- 12 Traceability -- 13 Failure Analysis of Semiconductor Dvices -- 14 Materials and Chemical Analysis of Electronic Devices -- 15 Modeling for Manufacturing Diagnostics -- 16 Artificial Intelligence Techniques for Analysis: Expert Systems and Neural Networks -- 17 Statistical Quality Control -- 18 Reliability/Defect Severity -- 19 Burn-In -- 20 Defect Prevention. | |
504 | |a Includes bibliographical references and index. | ||
520 | |a This exhaustive new handbook is a practical guide to achieving higher manufacturing yields and greater product reliability. Demonstrating how to put a cap on skyroocketing manufacturing costs, the book reveals ways to pinpoint and quickly correct the defects that reduce overall manufacturing yield. | ||
546 | |a English. | ||
650 | 0 | |a Engineering. | |
650 | 0 | |a Microprogramming. | |
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