Microelectronics Manufacturing Diagnostics Handbook / edited by Abraham H. Landzberg.

This exhaustive new handbook is a practical guide to achieving higher manufacturing yields and greater product reliability. Demonstrating how to put a cap on skyroocketing manufacturing costs, the book reveals ways to pinpoint and quickly correct the defects that reduce overall manufacturing yield.

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Bibliographic Details
Online Access: Full Text (via Springer)
Main Author: Landzberg, Abraham H.
Format: eBook
Language:English
Published: Boston, MA : Springer US, 1993.
Subjects:

MARC

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245 1 0 |a Microelectronics Manufacturing Diagnostics Handbook /  |c edited by Abraham H. Landzberg. 
260 |a Boston, MA :  |b Springer US,  |c 1993. 
300 |a 1 online resource (xxxiii, 633 pages) 
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505 0 |a 1 Introduction -- 2 Manufacturing Yield -- 3 Problem Diagnostics -- 4 Manufacturing Defect Classification System -- 5 Product Dimensional Metrology and Pattern Defect Inspection -- 6 Process and Tool Monitoring -- 7 Contamination Monitoring -- 8 Repair and Rework -- 9 Test Sites and Vehicles For Yield and Process Monitoring -- 10 In-Line Electrical Test -- 11 Final Test -- 12 Traceability -- 13 Failure Analysis of Semiconductor Dvices -- 14 Materials and Chemical Analysis of Electronic Devices -- 15 Modeling for Manufacturing Diagnostics -- 16 Artificial Intelligence Techniques for Analysis: Expert Systems and Neural Networks -- 17 Statistical Quality Control -- 18 Reliability/Defect Severity -- 19 Burn-In -- 20 Defect Prevention. 
504 |a Includes bibliographical references and index. 
520 |a This exhaustive new handbook is a practical guide to achieving higher manufacturing yields and greater product reliability. Demonstrating how to put a cap on skyroocketing manufacturing costs, the book reveals ways to pinpoint and quickly correct the defects that reduce overall manufacturing yield. 
546 |a English. 
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