Scanning Microscopies 2013 : Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences ; 30 April-1 May 2013, Baltimore, Maryland, United States / Michael T. Postek [and three others], editors ; sponsored and published by SPIE.

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Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library) Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences -- SPIE Digital Library - Conference Proceedings
Corporate Author:	SPIE (Society) (sponsoring body.)
Other Authors:	Postek, Michael T. (Editor)
Other title:	Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences. SPIE digital library.
Format:	eBook
Language:	English
Published:	Bellingham, Washington : SPIE, [2013]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 8729.
Subjects:	Scanning electron microscopes > Congresses. Scanning electron microscopes. Conference papers and proceedings.

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