Scanning Microscopies 2013 : Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences ; 30 April-1 May 2013, Baltimore, Maryland, United States / Michael T. Postek [and three others], editors ; sponsored and published by SPIE.
Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
Saved in:
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Full Text (via SPIE Digital Library) Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences -- SPIE Digital Library - Conference Proceedings |
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| Corporate Author: | |
| Other Authors: | |
| Other title: | Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences. SPIE digital library. |
| Format: | eBook |
| Language: | English |
| Published: |
Bellingham, Washington :
SPIE,
[2013]
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 8729. |
| Subjects: |
MARC
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