Scanning Microscopies 2013 : Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences ; 30 April-1 May 2013, Baltimore, Maryland, United States / Michael T. Postek [and three others], editors ; sponsored and published by SPIE.
Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
Saved in:
Online Access: |
Full Text (via SPIE Digital Library) Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences -- SPIE Digital Library - Conference Proceedings |
---|---|
Corporate Author: | |
Other Authors: | |
Other title: | Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences. SPIE digital library. |
Format: | eBook |
Language: | English |
Published: |
Bellingham, Washington :
SPIE,
[2013]
|
Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 8729. |
Subjects: |
Summary: | Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature. |
---|---|
Physical Description: | 1 online resource : illustrations (some color) |
Bibliography: | Includes bibliographical references. |
ISSN: | 0277-786X ; |