Stray-electron accumulation and effects in HIF accelerators [electronic resource]
Stray electrons can be introduced in positive-charge accelerators for heavy ion fusion (or other applications) as a result of ionization of ambient gas or gas released from walls due to halo-ion impact, or as a result of secondary-electron emission. Electron accumulation is impacted by the ion beam...
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Online Access |
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| Corporate Author: | |
| Format: | Government Document Electronic eBook |
| Language: | English |
| Published: |
Washington, D.C. : Oak Ridge, Tenn. :
United States. Dept. of Energy ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy,
2003.
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| Subjects: |
Internet
Online AccessOnline
| Call Number: |
E 1.99: cbp note - 520
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| E 1.99: cbp note - 520 | Available |